释义 |
level-sensitive scan design level-sensitive scan design(circuit design) (LSSD) A kind of scan design which usesseparate system and scan clocks to distinguish between normaland test mode. Latches are used in pairs, each has a normaldata input, data output and clock for system operation. Fortest operation, the two latches form a master/slave pair withone scan input, one scan output and non-overlapping scanclocks A and B which are held low during system operation butcause the scan data to be latched when pulsed high duringscan.
____| |Sin ----|S |A ------|> || Q|---+--------------- Q1D1 -----|D | |CLK1 ---|> | ||____| | ____| | |+---|S |B -------------------|> || Q|------ Q2 / SOutD2 ------------------|D |CLK2 ----------------|> ||____|
In a single latch LSSD configuration, the second latch is usedonly for scan operation. Allowing it to be use as a secondsystem latch reduces the silicon overhead. |