释义 |
Linnik interference microscope Linnik interference microscope[′lin·ik ‚in·tər¦fir·əns ′mī·krə‚skōp] (optics) A type of interference microscope used for studying the surface structure of reflecting specimens; light from a source is divided by a semireflecting mirror into two beams, one of which is focused through an objective onto the specimen surface, the other onto a comparison surface; after reflection from the respective surfaces, the beams are reunited by the mirror. |