单词 | secondary ion mass spectrometry |
释义 | secondary ion mass spectrometrysecondary ion mass spectrometryA technique of mass spectrometry in which a beam of energised ions (appoximately 5 keV in energy) is used to sputter sample atoms and molecules from a thin solid film or surface (classic SIMS), or organic molecules that may be present as a thin film or dissolved in a liquid or solid solution (molecular SIMS or liquid SIMS) held on the surface of a beam-intersecting sample probe.See SIMS |
随便看 |
|
英语词典包含2567994条英英释义在线翻译词条,基本涵盖了全部常用单词的英英翻译及用法,是英语学习的有利工具。