scan design

(electronics)(Or "Scan-In, Scan-Out") A electronic circuitdesign technique which aims to increase the controllabilityand observability of a digital logic circuit byincorporating special "scan registers" into the circuit sothat they form a scan path.

Some of the more common types of scan design include themultiplexed register designs and level-sensitive scan design (LSSD) used extensively by IBM. Boundary scan canbe used alone or in combination with either of the abovetechniques.

["Digital Systems Testing and Testable Design" by Abramovici,Breuer, and Friedman, ISBN 0-7167-8179-4].

["Design of Testable Logic Circuits" by R.G. Bennetts,(Brunel/Southhampton Universities), ISBN 0-201-14403-4].

单词	scan design
释义	scan design scan design (electronics)(Or "Scan-In, Scan-Out") A electronic circuitdesign technique which aims to increase the controllabilityand observability of a digital logic circuit byincorporating special "scan registers" into the circuit sothat they form a scan path. Some of the more common types of scan design include themultiplexed register designs and level-sensitive scan design (LSSD) used extensively by IBM. Boundary scan canbe used alone or in combination with either of the abovetechniques. ["Digital Systems Testing and Testable Design" by Abramovici,Breuer, and Friedman, ISBN 0-7167-8179-4]. ["Design of Testable Logic Circuits" by R.G. Bennetts,(Brunel/Southhampton Universities), ISBN 0-201-14403-4].
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